• Automatic fringe pattern enhancement using truly adaptive period-guided bidimensional empirical mode decomposition 

      Gocłowski, Paweł; Trusiak, Maciej; Ahmad, Azeem; Styk, Adam; Mico, Vicente; Ahluwalia, Balpreet Singh; Patorski, Krzysztof (Journal article; Tidsskriftartikkel; Peer reviewed, 2020-02-19)
      Fringe patterns encode the information about the result of a measurement performed via widely used optical full-field testing methods, e.g., interferometry, digital holographic microscopy, moiré techniques, structured illumination etc. Affected by the optical setup, changing environment and the sample itself fringe patterns are often corrupted with substantial noise, strong and uneven background ...
    • Single-shot fringe pattern phase retrieval using improved period-guided bidimensional empirical mode decomposition and Hilbert transform 

      Gocłowski, Paweł; Cywinska, Maria; Ahmad, Azeem; Ahluwalia, Balpreet Singh; Trusiak, Maciej (Journal article; Tidsskriftartikkel; Peer reviewed, 2021-09-17)
      Fringe pattern analysis is the central aspect of numerous optical measurement methods, e.g., interferometry, fringe projection, digital holography, quantitative phase microscopy. Experimental fringe patterns always contain significant features originating from fluctuating environment, optical system and illumination quality, and the sample itself that severely affect analysis outcome. Before the ...